ITECH IT2800 Series – Graphical Source Measure Unit
The IT2800 Series are compact and cost-effective bench-top Source Measure Units (SMUs) with the capability to source and measure both voltage and current. The IT2800 Series combine the capabilities of a voltage source, a current source, a voltage meter, a current meter and an ohmmeter (along with the capability to switch easily between these various functions). With a current range of 10fA to 10A and a voltage range of 100nV to 1000V, the IT2800 series SMU has capabilities that allow it to perform more than just simple DC and pulsed measurements to prevent errors in measurement results due to the device’s own heating.
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Winner of The Electronics Industry Awards 2023 Test, Measurement & Inspection Product of the Year
Features
- 5 inch touch display supports both graphical and numerical view modes.
- Combines the capabilities of six devices in one: Voltage Source, Current Source, 6 ½ Digital Multimeter (DCV,DCI, ohms), Battery Simulator, Electronic Load and Pulse Generator
- Integrating 4-quadrant sourcing & measuring capabilities, and supporting Two-wire & Four-wire measurement
- Resolution up to 10fA/100nV, sampling rate up to 10us.
- Three graphic display modes: Graph View, Scope View and Record View.
- Built-in battery simulator function, suitable for IOT low power precision measurement
- Sweep Capability: Linear/Log/ Pulsed-line AR/Pulsed-Log and LIST
- Multi-channel and simultaneous operation design, with parallel testing capability
- Built-in resistance, power, and Math measurement features
- With GUARD output function, suitable for low current measurement
- Front USB port used for data storage, screen capture, or test configuration import
- Built-in Digital IO/USB/LAN communication interface
Applications
- Discrete semiconductor devices
- Passive devices
- Transient suppression devices
- Laser diodes
- TVS
- Varistors
SPS5000 Semiconductor Parametric Test Software Now Available
The ITECH SPS5000 semiconductor parametric test software, paired with the IT2800 high-precision source measurement unit, streamlines semiconductor testing for device IV characterization and parametric evaluation. The SPS5000 supports various testing modes, including DC, pulse, single, and bidirectional sweeping. Its intuitive GUI enables university laboratories, semiconductor suppliers, and research institutes to perform semiconductor device characterization tests quickly and efficiently without the need for programming knowledge. The SPS5000 software includes ready-to-use test items for various semiconductor devices such as MOSFETs, BJTs, diodes, and resistors.
Features
- Intuitive GUI simplifies measurement setup, I-V characterization, and data analysis
- Ready-to-use test items for MOSFETs, BJTs, diodes, and resistors for quick recall
- Automated test sequence function enables continuous execution of multiple parameter tests for devices*1
- Interactive, real-time data plotting accelerates review of test results
- Quick test mode allows simultaneous testing of up to 32 DUTs
- Built-in database for rapid storage and recall of data and graphs
- Powerful graph analysis tools, including auto-scaling and line operations
- Multiple Y-axis capabilities with configurable parameter and scale types for both Y and X axes
- Customized test item function*2
- Compatible with Windows 7 or later operating systems
- Test fixture IT-E803 available for low-power diode and MOSFET testing (42V/1A)
- Compatible with IT2800 series SMU, with minimum resolution down to 100nV/10fA
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