Rigol DHO5000 Series - High Resolution Digital Oscilloscopes

Rigol DHO5000 Series – High Resolution Digital Oscilloscopes

500MHz – 1GHz Bandwidth
4-8 Channels
4GSa/s Real-time Sample Rate
500 Mpts Memory Depth (500M option available)
12 bit Vertical Resolution
10.1″ Touch Screen

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CONTACT INFORMATION

900 McKay Road, Unit 2
Pickering, Ontario
Canada, L1W 3X8

Phone: (905) 428-3413
Toll Free: (800) 617-3413

sales@electro-meters.com

Do you have questions about how we can help your company? Send us an email and we’ll get in touch shortly.

The MHO/DHO5000 series, built on RIGOL’s newly developed Centaurus platform, is a high-resolution 8-channel digital oscilloscope designed to meet mainstream applications in design, debugging, and testing.

Key Features

12-bit Resolution across all models
Bandwidth: Up to 1 GHz
Channels: 8 analog, 1 external trigger
Digital Channels: 16 (requires purchase of logic analyzer probe for MHO models)
Real-Time Sample Rate: Up to 4 GSa/s
Memory Depth: Max 500 Mpts
Vertical Sensitivity: As low as 100 μV/div
Waveform Capture Rate: Up to 1,000,000 wfms/s in fast recording mode
Advanced Analysis Tools: Includes Arbitrary Waveform/Function Generator (AFG), power analysis, histograms, digital signal analysis, Bode plot, and protocol decoding
Search & Navigation: Efficiently locates signals with exceptions
Display: 10.1” 1280×800 high-definition touch screen with 256-level intensity grading and real-time digital fluorescence technology
User Interface: Enhanced Flex knob for improved usability
Connectivity: USB Device, USB Host, LAN, HDMI interfaces standard on all models
Power Supply: Battery-powered, allowing for flexibility in measurement locations
Durability: Equipped with a photoelectric encoder operating knob for longevity
Online Upgrades for added functionality

The MHO/DHO5000 series delivers exceptional accuracy, with high waveform capture rates, deep memory, and a low-noise floor to meet complex testing requirements. Battery operation and comprehensive features make it ideal for a variety of demanding test environments.